The JEOL JEM-F200 CF-CR is an advanced transmission electron microscope capable of operating in both TEM (Transmission Electron Microscopy) and STEM (Scanning Transmission Electron Microscopy) modes. It is equipped with a Cold Field Emission Gun (Cold FEG) and a Cryo polepiece, enabling imaging and analysis of specimens at cryogenic temperatures (cryo-TEM). The microscope operates in the accelerating voltage range of 20–200 kV, achieving a resolution of 0.1 nm in TEM mode and 0.2 nm in STEM mode.

The detection system includes: HAADF, BF, BSE and EDS/EDX spectrometer (SDD 100 mm²) enabling the detection of elements from boron (B) to uranium (U) and the acquisition of high-resolution elemental maps. The instrument is equipped with two imaging cameras: Gatan Alpine – a Direct Electron Detection (DDD), Gatan Rio 16 (CMOS).