The invention relates to the scanning microscope system for forming an image of a sample. The system comprises a first optical system adapted to focus excitation light at the sample herewith causing at least one excitation light spot at the sample. The excitation light spot causes one or more optical excitations in the sample. The system also comprises a point spread function engineering module adapted to cause at least one dimension, e.g. a lateral size, of the excitation light spot at the sample to be smaller than one Airy unit. The system further comprises a second optical system adapted to focus emission light caused by the one or more optical excitations, at an imaging plane of an imaging system herewith causing at least one emission light spot at the imaging plane. The system also comprises a scanning system adapted to move the excitation light spot over or through the sample. Furthermore, the system comprises a rescanning system adapted to move the emission light spot over the imaging plane of the imaging system. The microscope system also comprises a control module adapted to control the scanning system and rescanning system to simultaneously move the excitation light spot over or through the sample at a first (scan) velocity and move the emission light spot over the imaging plane of the imaging system at a second velocity. The second velocity is higher than a baseline velocity, wherein the baseline velocity is defined as the first (scan) velocity multiplied by the optical magnification of the microscope system.

Nencki Institute is the co-applicant with University of Amsterdam". The University is responsible for patent protection and commercialization related activities.

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